IEEE International Integrated Reliability Workshop (IIRW)
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IIRW is a conference covering microelectronics reliability, including but not limited to device-level reliability, circuit, system and applicable level-reliability, memory reliability, and reliability characterization and testing.
With technical sponsorship from IEEE, this event anticipates that its proceedings will be indexed in leading databases such as Scopus, Web of Science (WoS), Ei Compendex, DBLP, and Google Scholar.