Design, Automation & Test in Europe Conference (DATE)

The conference addresses all aspects of research into technologies for electronic and systems engineering. It covers the design process, test, and tools for design automation of electronic products, ranging from integrated circuits to distributed large-scale systems. This domain includes both hardware and embedded software design issues. The conference scope also includes the specification of design requirements and new architectures for challenging application fields such as sustainable computing, smart societies and digital wellness, secure systems, autonomous systems and smart industry, and state-of-the-art applications of artificial intelligence. Engineers, scientists, and researchers involved in innovative industrial designs are particularly encouraged to submit papers to foster feedback ranging from design to research aspects.

Design, Automation & Test in Europe Conference (DATE) is technically sponsored by IEEE. The proceedings  of this event are likely to be indexed in  prominent databases such as Scopus, Web of Science (WoS), Ei Compendex, DBLP, Google Scholar, and many others.