IEEE 57th Semiconductor Interface Specialists Conference (SISC)

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The SISC provides a unique forum for device engineers, solid-state physicists, and materials scientists to discuss issues of common interest. Principal topics for discussion at SISC are semiconductor/insulator interfaces, the physics of insulating thin films, and the interaction among materials science, device physics, and state-of-the-art technology.

IEEE 57th Semiconductor Interface Specialists Conference (SISC) is technically sponsored by IEEE. The proceedings  will be submitted for inclusion in Web of Science (WoS), Scopus, Ei Compendex, DBLP, Google Scholar, and many others databases.

 

Dates

09 Dec. 2026
12 Dec. 2026
 

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