We encourage the submission of original papers demonstrating innovative approaches to tackle measurement challenges inherently linked to the high explosion of diverse applications based on EM waves. Suggested topics include but are not limited to:

Software, machine learning methods and AI application, open-source tools for automation in modern microwave measurements
De-embedding, calibration, and characterization techniques
Characterization of material properties and biological samples
On-wafer characterization
Millimeter-wave antenna and OTA testing
Topics always of interest including:

RF/digital mixed-signal measurement and calibration
Nonlinear / large-signal measurement and modeling techniques
Terahertz measurement techniques
Other recent developments in metrology incl. measurement uncertainty