39th International Conference on Microelectronic Test Structures (ICMTS)

For more than 35 years ICMTS has been the most important open forum to report scientific results achieved by means of test structures. It provides the community with the opportunity to meet and present new ideas in the field of characterization techniques and, in particular, in the design, characterization and fabrication of test structures for micro and nano-electronics. The Conference will bring together designers and users of test structures to discuss recent developments and future directions, in a one-track program, with convivial breaks allowing attendees to discuss and exchange viewpoints and challenges also with equipment vendors.

With technical sponsorship from IEEE, this event anticipates that its proceedings will be indexed in leading databases such as Scopus, Web of Science (WoS), Ei Compendex, DBLP, and Google Scholar.