The conference topics focus on models, measuring techniques and simulation tools for engineering. It aims to bridge the gap between different areas, such as electronic engineering, communications, signal processing, electric engineering in terms of methods for modeling and experimental validation.

Advanced Topics on Measurement and Simulation (ATOMS) is technically sponsored by IEEE. The proceedings  of this event are likely to be indexed in  prominent databases such as Scopus, Web of Science (WoS), Ei Compendex, DBLP, Google Scholar, and many others.