The IEEE International Symposium on On-Line Testing and Robust System explores emerging trends and novel concepts related to all aspects of robustness of microelectronic circuits and systems.

IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) is technically sponsored by IEEE. The proceedings  of this event are likely to be indexed in  prominent databases such as Scopus, Web of Science (WoS), Ei Compendex, DBLP, Google Scholar, and many others.