IPFA 2026 is devoted to the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of failures in conventional, modern and disruptive semiconductor devices with heterogenous integration.

IEEE 33rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) is technically sponsored by IEEE. The proceedings  of this event are likely to be indexed in  prominent databases such as Scopus, Web of Science (WoS), Ei Compendex, DBLP, Google Scholar, and many others.