IEEE International Symposium on Artificial Intelligence for Instrumentation and Measurement (AI4IM)

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Artificial Intelligence (AI) is now prevalent in all technology domains, including instrumentation and measurement (I&M). In recent years, public discourse and media attention have largely centered on generative AI, particularly Large Language Models (LLMs), driven by the popularity of tools like ChatGPT and other chatbots. However, AI extends far beyond just LLMs, as shown in the diagram. Machine learning, deep learning, reinforcement learning, evolutionary computation, and logic are now routinely used in I&M systems for measurement, detection, tracking, monitoring, characterization, identification, sensing, estimation, recognition, or diagnosis of physical phenomena.

IEEE International Symposium on Artificial Intelligence for Instrumentation and Measurement (AI4IM) is technically sponsored by IEEE. The proceedings  of this event are likely to be indexed in  prominent databases such as Scopus, Web of Science (WoS), Ei Compendex, DBLP, Google Scholar, and many others.

 

Dates

21 May. 2026
23 May. 2026
 

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