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IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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Defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) is technically sponsored by IEEE. The proceedings of this event are likely to be listed in prestigious databases such as Scopus, Web of Science (WoS), Ei Compendex, DBLP, Google Scholar, and many others.