IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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Defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) is technically sponsored by IEEE. The proceedings will be submitted for inclusion in Web of Science (WoS), Scopus, Ei Compendex, DBLP, Google Scholar, and many others databases.