International Test Conference, the cornerstone of TestWeek events, is the premier comference dedicated to the electronic test of devices, boards, and systems – covering the complete cycle from design verification, test, diagnosis, failure analysis, and back to process improvement. AtITC, test and verification professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tools and equipment designers, and test engineers.

IEEE International Test Conference (ITC) is technically sponsored by IEEE. The proceedings  of this event are likely to be indexed in  prominent databases such as Scopus, Web of Science (WoS), Ei Compendex, DBLP, Google Scholar, and many others.